R. D. Blanton
About
R. D. Blanton has authored 22 papers that have received a total of 128 indexed citations.
This includes 19 papers in Electrical and Electronic Engineering, 19 papers in Hardware and Architecture and 2 papers in Industrial and Manufacturing Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (18 papers), VLSI and Analog Circuit Testing (18 papers) and Advancements in Photolithography Techniques (5 papers). R. D. Blanton is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (18 papers), VLSI and Analog Circuit Testing (18 papers) and Advancements in Photolithography Techniques (5 papers) and collaborates with scholars based in United States, Singapore and United Kingdom. R. D. Blanton's co-authors include Xin Li, Thijs Vogels, W. Maly, Yang Xue and Vítor Grade Tavares and has published in prestigious journals such as IEEE Transactions on Industrial Informatics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Semiconductor Manufacturing
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