R. Thun
About
R. Thun has authored 17 papers that have received a total of 346 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 5 papers in Surfaces, Coatings and Films and 3 papers in Materials Chemistry. The topics of these papers are Electron and X-Ray Spectroscopy Techniques (4 papers), Semiconductor materials and devices (3 papers) and Copper Interconnects and Reliability (2 papers). R. Thun is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (4 papers), Semiconductor materials and devices (3 papers) and Copper Interconnects and Reliability (2 papers) and collaborates with scholars based in United States, Germany and Czechia. R. Thun's co-authors include G. Hass, Jason Ramsey, H.-B. Schilling, Petr Solich and L. I. Maissel and has published in prestigious journals such as Physics Today, Journal of The Electrochemical Society and Review of Scientific Instruments
In The Last Decade
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