R.‐P. Haelbich
About
R.‐P. Haelbich has authored 15 papers that have received a total of 503 indexed citations.
This includes 9 papers in Electrical and Electronic Engineering, 7 papers in Surfaces, Coatings and Films and 6 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Electron and X-Ray Spectroscopy Techniques (5 papers), Advancements in Photolithography Techniques (4 papers) and Surface Roughness and Optical Measurements (4 papers). R.‐P. Haelbich is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (5 papers), Advancements in Photolithography Techniques (4 papers) and Surface Roughness and Optical Measurements (4 papers) and collaborates with scholars based in Germany and United States. R.‐P. Haelbich's co-authors include C. Kunz, H. Hogrefe, Eberhard Spiller, J. P. Silverman and J. M. Warlaumont and has published in prestigious journals such as Applied Physics Letters, Annals of the New York Academy of Sciences and Chemical Physics Letters
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