Rubin Parekhji
About
Rubin Parekhji has authored 19 papers that have received a total of 69 indexed citations.
This includes 19 papers in Electrical and Electronic Engineering, 16 papers in Hardware and Architecture and 3 papers in Biomedical Engineering. The topics of these papers are VLSI and Analog Circuit Testing (16 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Low-power high-performance VLSI design (6 papers). Rubin Parekhji is often cited by papers focused on VLSI and Analog Circuit Testing (16 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Low-power high-performance VLSI design (6 papers) and collaborates with scholars based in United States, Greece and United Arab Emirates. Rubin Parekhji's co-authors include Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Sule Ozev and G. Venkatesh and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Journal of Electronic Testing.
In The Last Decade
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