Saif Zahir
About
Saif Zahir has authored 13 papers that have received a total of 276 indexed citations.
This includes 5 papers in Computer Vision and Pattern Recognition, 3 papers in Electrical and Electronic Engineering and 3 papers in Hardware and Architecture. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (3 papers) and Advanced Data Compression Techniques (3 papers). Saif Zahir is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (3 papers) and Advanced Data Compression Techniques (3 papers) and collaborates with scholars based in Canada, Saudi Arabia and United Kingdom. Saif Zahir's co-authors include Han Donker, Esam Khan, Aiman H. El‐Maleh, Rabab Ward and Debra Isaac and has published in prestigious journals such as Journal of Business Ethics, Corporate Governance and Computers & Electrical Engineering
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