Saqib Khursheed
About
Saqib Khursheed has authored 41 papers that have received a total of 295 indexed citations.
This includes 40 papers in Electrical and Electronic Engineering, 28 papers in Hardware and Architecture and 3 papers in Automotive Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (26 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (18 papers). Saqib Khursheed is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (26 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (18 papers) and collaborates with scholars based in United Kingdom, United States and Saudi Arabia. Saqib Khursheed's co-authors include Bashir M. Al‐Hashimi, Daniele Rossi, Sheng Yang, S.M. Reddy and David Flynn and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Circuits and Systems I Regular Papers
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