T. F. Miyahira
About
T. F. Miyahira has authored 32 papers that have received a total of 504 indexed citations.
This includes 30 papers in Electrical and Electronic Engineering, 9 papers in Hardware and Architecture and 3 papers in Radiation. The topics of these papers are Radiation Effects in Electronics (22 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and VLSI and Analog Circuit Testing (7 papers). T. F. Miyahira is often cited by papers focused on Radiation Effects in Electronics (22 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and VLSI and Analog Circuit Testing (7 papers) and collaborates with scholars based in United States and France. T. F. Miyahira's co-authors include A.H. Johnston, Larry D. Edmonds, G.M. Swift, Farokh Irom and Heidi N. Becker and has published in prestigious journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and IEEE Transactions on Nuclear Science
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