Thomas Zeschke
About
Thomas Zeschke has authored 40 papers that have received a total of 825 indexed citations.
This includes 24 papers in Radiation, 18 papers in Mechanical Engineering and 17 papers in Biomedical Engineering. The topics of these papers are Advanced X-ray Imaging Techniques (24 papers), Advanced Measurement and Metrology Techniques (18 papers) and Chemical Mechanical Polishing in Microelectronics Manufacturing (13 papers). Thomas Zeschke is often cited by papers focused on Advanced X-ray Imaging Techniques (24 papers), Advanced Measurement and Metrology Techniques (18 papers) and Chemical Mechanical Polishing in Microelectronics Manufacturing (13 papers) and collaborates with scholars based in Germany, United States and India. Thomas Zeschke's co-authors include Frank Siewert, F. Senf, Valeriy V. Yashchuk, F. Eggenstein and R. Follath and has published in prestigious journals such as Optics Express, Review of Scientific Instruments and Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
In The Last Decade
Explore authors with similar magnitude of impact
Top authors papers by George Goodman are co-authored with Top journals papers by Joseph C. Goffreda are published in Top authors papers by Zhizhe Chen are co-authored with Top authors papers by Guolong Wang are co-authored with Top countries impacted by papers by Stefan J. Linz Top journals papers by Forbes Gibb are published in Top fields papers by V. Shankar Rao are about Top fields papers by J.M. Mwenda are about