T.M. Niermann
About
T.M. Niermann has authored 3 papers that have received a total of 138 indexed citations.
This includes 3 papers in Electrical and Electronic Engineering, 3 papers in Hardware and Architecture and 1 paper in Molecular Biology. The topics of these papers are VLSI and Analog Circuit Testing (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Radiation Effects in Electronics (1 paper). T.M. Niermann is often cited by papers focused on VLSI and Analog Circuit Testing (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Radiation Effects in Electronics (1 paper) and collaborates with scholars based in United States. T.M. Niermann's co-authors include J.H. Patel, E.M. Rudnick, Jacob A. Abraham, Wu-Tung Cheng and Ranjan Roy and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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