Todd Bailey
About
Todd Bailey has authored 33 papers that have received a total of 702 indexed citations.
This includes 29 papers in Electrical and Electronic Engineering, 21 papers in Biomedical Engineering and 11 papers in Surfaces, Coatings and Films. The topics of these papers are Advancements in Photolithography Techniques (28 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and Nanofabrication and Lithography Techniques (11 papers). Todd Bailey is often cited by papers focused on Advancements in Photolithography Techniques (28 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and Nanofabrication and Lithography Techniques (11 papers) and collaborates with scholars based in United States, Japan and South Korea. Todd Bailey's co-authors include C. Grant Willson, John G. Ekerdt, Matthew Colburn, S. V. Sreenivasan and Byung Jin Choi and has published in prestigious journals such as Journal of Micro/Nanolithography MEMS and MOEMS
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