Toh‐Ming Lu
About
Toh‐Ming Lu has authored 366 papers that have received a total of 9.7k indexed citations.
This includes 214 papers in Electrical and Electronic Engineering, 130 papers in Materials Chemistry and 102 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Semiconductor materials and devices (114 papers), Copper Interconnects and Reliability (85 papers) and Metal and Thin Film Mechanics (53 papers). Toh‐Ming Lu is often cited by papers focused on Semiconductor materials and devices (114 papers), Copper Interconnects and Reliability (85 papers) and Metal and Thin Film Mechanics (53 papers) and collaborates with scholars based in United States, China and Australia. Toh‐Ming Lu's co-authors include G.-C. Wang, Yiping Zhao, Tansel Karabacak, Zonghuan Lu and Jian Shi and has published in prestigious journals such as Proceedings of the National Academy of Sciences, Physical Review Letters and Journal of the American Chemical Society
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