Tomoo Inoue
About
Tomoo Inoue has authored 41 papers that have received a total of 214 indexed citations.
This includes 19 papers in Hardware and Architecture, 17 papers in Electrical and Electronic Engineering and 7 papers in Computer Vision and Pattern Recognition. The topics of these papers are VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Radiation Effects in Electronics (9 papers). Tomoo Inoue is often cited by papers focused on VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Radiation Effects in Electronics (9 papers) and collaborates with scholars based in Japan, United Kingdom and Italy. Tomoo Inoue's co-authors include Hideo Fujiwara, Tatsuki Okamoto, Tokumi Yokohira, Tsunetsugu Munakata and Satoshi Ohtake and has published in prestigious journals such as IEEE Transactions on Parallel and Distributed Systems, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Lecture notes in computer science
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