V. M. Dwyer
About
V. M. Dwyer has authored 75 papers that have received a total of 639 indexed citations.
This includes 29 papers in Electrical and Electronic Engineering, 19 papers in Atomic and Molecular Physics, and Optics and 13 papers in Surfaces, Coatings and Films. The topics of these papers are Copper Interconnects and Reliability (13 papers), Semiconductor materials and devices (13 papers) and Electron and X-Ray Spectroscopy Techniques (13 papers). V. M. Dwyer is often cited by papers focused on Copper Interconnects and Reliability (13 papers), Semiconductor materials and devices (13 papers) and Electron and X-Ray Spectroscopy Techniques (13 papers) and collaborates with scholars based in United Kingdom, Japan and United States. V. M. Dwyer's co-authors include J.A.D. Matthew, M. J. Everitt, M.J. Kearney, V.A. Chouliaras and Todd Tilma and has published in prestigious journals such as Physical Review Letters, The Journal of Chemical Physics and Journal of Applied Physics
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