Vadim Okun

3 papers and 153 indexed citations i.

Vadim Okun has authored 3 papers that have received a total of 153 indexed citations. This includes 2 papers in Hardware and Architecture, 2 papers in Software and 1 paper in Artificial Intelligence. The topics of these papers are VLSI and Analog Circuit Testing (2 papers), Software Testing and Debugging Techniques (2 papers) and Software Reliability and Analysis Research (2 papers). Vadim Okun is often cited by papers focused on VLSI and Analog Circuit Testing (2 papers), Software Testing and Debugging Techniques (2 papers) and Software Reliability and Analysis Research (2 papers) and collaborates with scholars based in United States. Vadim Okun's co-authors include Yu Lei, James F. Lawrence, Elizabeth Fong, Raghu N. Kacker and Yaacov Yesha and has published in prestigious journals such as Information and Software Technology and Software Testing Verification and Reliability