Vu Le
About
Vu Le has authored 25 papers that have received a total of 190 indexed citations.
This includes 10 papers in Electrical and Electronic Engineering, 8 papers in Management Science and Operations Research and 6 papers in Industrial and Manufacturing Engineering. The topics of these papers are Electrical Fault Detection and Protection (9 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Simulation Techniques and Applications (5 papers). Vu Le is often cited by papers focused on Electrical Fault Detection and Protection (9 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Simulation Techniques and Applications (5 papers) and collaborates with scholars based in Australia and United States. Vu Le's co-authors include Doug Creighton, Xiu Yao, Michael Johnstone, Saeid Nahavandi and Chad Miller and has published in prestigious journals such as IEEE Transactions on Power Electronics, Expert Systems with Applications and Economics Letters
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