W. Cote

5 papers and 110 indexed citations i.

W. Cote has authored 5 papers that have received a total of 110 indexed citations. This includes 5 papers in Electrical and Electronic Engineering, 2 papers in Electronic, Optical and Magnetic Materials and 1 paper in Biomedical Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (3 papers), Semiconductor materials and devices (3 papers) and Copper Interconnects and Reliability (2 papers). W. Cote is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (3 papers), Semiconductor materials and devices (3 papers) and Copper Interconnects and Reliability (2 papers) and collaborates with scholars based in United States and Switzerland. W. Cote's co-authors include D. V. Podlesnik, Stephen R. Fox, Walter Lange, R. Franch and R.H. Dennard and has published in prestigious journals such as Thin Solid Films, IEEE Journal of Solid-State Circuits and IBM Journal of Research and Development