W. Huott

6 papers and 54 indexed citations i.

W. Huott has authored 6 papers that have received a total of 54 indexed citations. This includes 6 papers in Electrical and Electronic Engineering, 3 papers in Hardware and Architecture and 2 papers in Biomedical Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (4 papers), VLSI and Analog Circuit Testing (2 papers) and Radiation Effects in Electronics (2 papers). W. Huott is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (4 papers), VLSI and Analog Circuit Testing (2 papers) and Radiation Effects in Electronics (2 papers) and collaborates with scholars based in United States. W. Huott's co-authors include D.R. Knebel, Y.H. Chan, Bryan Robbins, S. Polonsky and S.E. Steen and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IBM Journal of Research and Development and Microelectronics Reliability