Wei-Cheng Lai
About
Wei-Cheng Lai has authored 22 papers that have received a total of 800 indexed citations.
This includes 8 papers in Electrical and Electronic Engineering, 6 papers in Biomedical Engineering and 5 papers in Hardware and Architecture. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (5 papers) and Radiation Effects in Electronics (4 papers). Wei-Cheng Lai is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (5 papers) and Radiation Effects in Electronics (4 papers) and collaborates with scholars based in Taiwan, United States and China. Wei-Cheng Lai's co-authors include Kwang‐Ting Cheng, A. Krstić, S. Dey, Ya‐Ping Hsieh and Mario Hofmann and has published in prestigious journals such as Applied Physics Letters, Langmuir and Journal of The Electrochemical Society
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