Weijie Shi
About
Weijie Shi has authored 23 papers that have received a total of 170 indexed citations.
This includes 11 papers in Electrical and Electronic Engineering, 7 papers in Computer Vision and Pattern Recognition and 5 papers in Information Systems. The topics of these papers are Advancements in Photolithography Techniques (7 papers), Optical measurement and interference techniques (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Weijie Shi is often cited by papers focused on Advancements in Photolithography Techniques (7 papers), Optical measurement and interference techniques (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers) and collaborates with scholars based in China, Hong Kong and Canada. Weijie Shi's co-authors include Zongpeng Li, Chuan Wu, Francis C. M. Lau, Jianming Hu and Xuelian Yu and has published in prestigious journals such as Medicine, IEEE/ACM Transactions on Networking and Applied Sciences
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