Yanghong Tan
About
Yanghong Tan has authored 27 papers that have received a total of 276 indexed citations.
This includes 22 papers in Electrical and Electronic Engineering, 15 papers in Control and Systems Engineering and 9 papers in Hardware and Architecture. The topics of these papers are VLSI and Analog Circuit Testing (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Optimal Power Flow Distribution (6 papers). Yanghong Tan is often cited by papers focused on VLSI and Analog Circuit Testing (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Optimal Power Flow Distribution (6 papers) and collaborates with scholars based in China and United Kingdom. Yanghong Tan's co-authors include Yichuang Sun, Lin Jiang, Yigang He, Xi Yang and Yigang He and has published in prestigious journals such as PLoS ONE, Electronics Letters and Energies
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