Yibing Shi

74 papers and 977 indexed citations i.

Yibing Shi has authored 74 papers that have received a total of 977 indexed citations. This includes 21 papers in Electrical and Electronic Engineering, 16 papers in Mechanical Engineering and 15 papers in Hardware and Architecture. The topics of these papers are VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Non-Destructive Testing Techniques (10 papers). Yibing Shi is often cited by papers focused on VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Non-Destructive Testing Techniques (10 papers) and collaborates with scholars based in China, United States and Singapore. Yibing Shi's co-authors include Wei Feng, Fuyou Li, Yanjun Li and Wei Yuan and has published in prestigious journals such as Advanced Materials, Biomaterials and Chemical Communications