Yibing Shi
About
Yibing Shi has authored 76 papers that have received a total of 1.0k indexed citations.
This includes 22 papers in Electrical and Electronic Engineering, 16 papers in Mechanical Engineering and 15 papers in Hardware and Architecture. The topics of these papers are VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Non-Destructive Testing Techniques (10 papers). Yibing Shi is often cited by papers focused on VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Non-Destructive Testing Techniques (10 papers) and collaborates with scholars based in China, United States and United Kingdom. Yibing Shi's co-authors include Wei Feng, Fuyou Li, Yanjun Li and Жипенг Ли and has published in prestigious journals such as Advanced Materials, Biomaterials and Chemical Communications.
In The Last Decade
Fields of papers published by Yibing Shi
Since SpecializationEngineeringComputer SciencePhysics and AstronomyMathematicsEarth and Planetary SciencesEnergyEnvironmental ScienceMaterials ScienceChemical EngineeringChemistryAgricultural and Biological SciencesVeterinaryDecision SciencesArts and HumanitiesBusiness, Management and AccountingSocial SciencesPsychologyEconomics, Econometrics and FinanceHealth ProfessionsDentistryMedicineBiochemistry, Genetics and Molecular BiologyNeuroscienceNursingImmunology and MicrobiologyPharmacology, Toxicology and Pharmaceutics
Countries citing papers authored by Yibing Shi
Since SpecializationCitations
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