Yigang He
About
Yigang He has authored 77 papers that have received a total of 1.0k indexed citations.
This includes 62 papers in Electrical and Electronic Engineering, 17 papers in Control and Systems Engineering and 17 papers in Hardware and Architecture. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (17 papers), VLSI and Analog Circuit Testing (17 papers) and RFID technology advancements (9 papers). Yigang He is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (17 papers), VLSI and Analog Circuit Testing (17 papers) and RFID technology advancements (9 papers) and collaborates with scholars based in China, United Kingdom and United States. Yigang He's co-authors include Lifen Yuan, Chaolong Zhang and Bing Li and has published in prestigious journals such as IEEE Transactions on Power Electronics, Sensors and IEEE Access
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