Yongchan Ban
About
Yongchan Ban has authored 24 papers that have received a total of 166 indexed citations.
This includes 24 papers in Electrical and Electronic Engineering, 9 papers in Hardware and Architecture and 4 papers in Biomedical Engineering. The topics of these papers are Advancements in Photolithography Techniques (20 papers), VLSI and Analog Circuit Testing (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Yongchan Ban is often cited by papers focused on Advancements in Photolithography Techniques (20 papers), VLSI and Analog Circuit Testing (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers) and collaborates with scholars based in United States, South Korea and Taiwan. Yongchan Ban's co-authors include David Z. Pan, Minsik Cho, Yuansheng Ma, Woo Hyun Paik and Yen‐Hung Lin and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Journal on Emerging and Selected Topics in Circuits and Systems and Journal of Micro/Nanolithography MEMS and MOEMS
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