Youhua Shi
About
Youhua Shi has authored 30 papers that have received a total of 165 indexed citations.
This includes 19 papers in Electrical and Electronic Engineering, 17 papers in Hardware and Architecture and 7 papers in Artificial Intelligence. The topics of these papers are VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (9 papers). Youhua Shi is often cited by papers focused on VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (9 papers) and collaborates with scholars based in Japan, United States and China. Youhua Shi's co-authors include Masao Yanagisawa, Nozomu Togawa, Tatsuo Ohtsuki, Masaru Oya and Shinji Kimura and has published in prestigious journals such as IEEE Transactions on Power Electronics, IEEE Access and IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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