Y.R. Xing
About
Y.R. Xing has authored 16 papers that have received a total of 358 indexed citations.
This includes 13 papers in Electrical and Electronic Engineering, 8 papers in Surfaces, Coatings and Films and 7 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Semiconductor materials and devices (10 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Ion-surface interactions and analysis (5 papers). Y.R. Xing is often cited by papers focused on Semiconductor materials and devices (10 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Ion-surface interactions and analysis (5 papers) and collaborates with scholars based in China and Germany. Y.R. Xing's co-authors include W. Ranke, Ge Shen, Jinghong Ma, Dieter Schmeißer and Zhangda Lin and has published in prestigious journals such as Small, Surface Science and Applied Surface Science
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