Y.R. Xing
About
Y.R. Xing has authored 16 papers that have received a total of 358 indexed citations.
This includes 13 papers in Electrical and Electronic Engineering, 8 papers in Surfaces, Coatings and Films and 7 papers in Atomic and Molecular Physics, and Optics. The topics of these papers are Semiconductor materials and devices (10 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Ion-surface interactions and analysis (5 papers). Y.R. Xing is often cited by papers focused on Semiconductor materials and devices (10 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Ion-surface interactions and analysis (5 papers) and collaborates with scholars based in China and Germany. Y.R. Xing's co-authors include W. Ranke, Ge Shen, Jinghong Ma, Dieter Schmeißer and Zhangda Lin and has published in prestigious journals such as Small, Surface Science and Applied Surface Science
In The Last Decade
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