Yu Hu
About
Yu Hu has authored 62 papers that have received a total of 406 indexed citations.
This includes 44 papers in Hardware and Architecture, 38 papers in Electrical and Electronic Engineering and 14 papers in Computer Vision and Pattern Recognition. The topics of these papers are VLSI and Analog Circuit Testing (29 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (12 papers). Yu Hu is often cited by papers focused on VLSI and Analog Circuit Testing (29 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (12 papers) and collaborates with scholars based in China, United States and Hong Kong. Yu Hu's co-authors include Xiaowei Li, Jing Ye, Huawei Li and Qiang Xu and has published in prestigious journals such as IEEE Access, Neural Networks and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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