Yu-Jen Huang
About
Yu-Jen Huang has authored 11 papers that have received a total of 103 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 6 papers in Hardware and Architecture and 4 papers in Computer Networks and Communications. The topics of these papers are VLSI and Analog Circuit Testing (5 papers), 3D IC and TSV technologies (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). Yu-Jen Huang is often cited by papers focused on VLSI and Analog Circuit Testing (5 papers), 3D IC and TSV technologies (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers) and collaborates with scholars based in Taiwan. Yu-Jen Huang's co-authors include Jin-Fu Li and Cheng‐Hsien Wu and has published in prestigious journals such as The International Journal of Advanced Manufacturing Technology, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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