Benoit Nadeau-Dostie
About
Benoit Nadeau-Dostie has authored 12 papers that have received a total of 211 indexed citations.
This includes 12 papers in Electrical and Electronic Engineering, 11 papers in Hardware and Architecture and 4 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (11 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Fault Diagnosis in Complex Systems (4 papers). Benoit Nadeau-Dostie is often cited by papers focused on VLSI and Analog Circuit Testing (11 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Fault Diagnosis in Complex Systems (4 papers) and collaborates with scholars based in Canada, United States and Hungary. Benoit Nadeau-Dostie's co-authors include V.K. Agarwal, Nur A. Touba, Jerzy Tyszer, Janusz Rajski and Joon-Sung Yang and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, Computer and IEEE Transactions on Computers
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