C. Landrault
About
C. Landrault has authored 39 papers that have received a total of 218 indexed citations.
This includes 37 papers in Electrical and Electronic Engineering, 33 papers in Hardware and Architecture and 3 papers in Software. The topics of these papers are VLSI and Analog Circuit Testing (32 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers) and Radiation Effects in Electronics (9 papers). C. Landrault is often cited by papers focused on VLSI and Analog Circuit Testing (32 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers) and Radiation Effects in Electronics (9 papers) and collaborates with scholars based in France, Germany and United States. C. Landrault's co-authors include S. Pravossoudovitch, Patrick Girard, A. Virazel, L. Guiller and David Roche and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Reliability and Microelectronics Reliability
In The Last Decade
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