C. Surisetty
About
C. Surisetty has authored 11 papers that have received a total of 112 indexed citations.
This includes 9 papers in Electrical and Electronic Engineering, 8 papers in Biomedical Engineering and 4 papers in Electronic, Optical and Magnetic Materials. The topics of these papers are Chemical Mechanical Polishing in Microelectronics Manufacturing (8 papers), Copper Interconnects and Reliability (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). C. Surisetty is often cited by papers focused on Chemical Mechanical Polishing in Microelectronics Manufacturing (8 papers), Copper Interconnects and Reliability (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers) and collaborates with scholars based in United States, Qatar and Germany. C. Surisetty's co-authors include S. V. Babu, Stan Tsai, D. Roy, Walter Kleemeier and R. Patlolla and has published in prestigious journals such as Journal of The Electrochemical Society, Electrochemical and Solid-State Letters and Journal of Applied Electrochemistry
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