C.F. Hawkins
About
C.F. Hawkins has authored 46 papers that have received a total of 846 indexed citations.
This includes 38 papers in Electrical and Electronic Engineering, 24 papers in Hardware and Architecture and 3 papers in Electronic, Optical and Magnetic Materials. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (34 papers), VLSI and Analog Circuit Testing (24 papers) and Semiconductor materials and devices (19 papers). C.F. Hawkins is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (34 papers), VLSI and Analog Circuit Testing (24 papers) and Semiconductor materials and devices (19 papers) and collaborates with scholars based in United States, Spain and Canada. C.F. Hawkins's co-authors include J.M. Soden, A. Keshavarzi, Alan Righter, J. Segura and Kaushik Roy and has published in prestigious journals such as Gut, IEEE Transactions on Industrial Electronics and Electronics Letters
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