Dan Alexandrescu
About
Dan Alexandrescu has authored 26 papers that have received a total of 216 indexed citations.
This includes 25 papers in Electrical and Electronic Engineering, 11 papers in Hardware and Architecture and 4 papers in Safety, Risk, Reliability and Quality. The topics of these papers are Radiation Effects in Electronics (21 papers), VLSI and Analog Circuit Testing (9 papers) and Semiconductor materials and devices (8 papers). Dan Alexandrescu is often cited by papers focused on Radiation Effects in Electronics (21 papers), VLSI and Analog Circuit Testing (9 papers) and Semiconductor materials and devices (8 papers) and collaborates with scholars based in France, Italy and The Netherlands. Dan Alexandrescu's co-authors include Adrian Evans, Mehdi B. Tahoori, Maksim Jenihhin, Mojtaba Ebrahimi and Antonio Rubio and has published in prestigious journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Microelectronics Reliability
In The Last Decade
Explore authors with similar magnitude of impact
Top authors papers by Yuanwu Lei are co-authored with Top fields papers by Georgios Malandrakis are about Top journals papers by Sonam Sonam are published in Top journals papers by N Kotschy-Lang are published in Top fields papers by M. Taboada are about Top fields papers by Antoni Guasch are about Top countries impacted by papers by R Schäfer Top journals papers by Tor‐Johan Ekeland are published in