Maksim Jenihhin
About
Maksim Jenihhin has authored 48 papers that have received a total of 136 indexed citations.
This includes 35 papers in Electrical and Electronic Engineering, 28 papers in Hardware and Architecture and 12 papers in Software. The topics of these papers are Radiation Effects in Electronics (22 papers), VLSI and Analog Circuit Testing (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Maksim Jenihhin is often cited by papers focused on Radiation Effects in Electronics (22 papers), VLSI and Analog Circuit Testing (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers) and collaborates with scholars based in Estonia, Italy and The Netherlands. Maksim Jenihhin's co-authors include Jaan Raik, M. Sonza Reorda, Raimund Ubar, Masoud Daneshtalab and Gert Jervan and has published in prestigious journals such as Sensors, IEEE Access and ACM Computing Surveys
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