Raimund Ubar
About
Raimund Ubar has authored 81 papers that have received a total of 211 indexed citations.
This includes 71 papers in Hardware and Architecture, 57 papers in Electrical and Electronic Engineering and 17 papers in Computational Theory and Mathematics. The topics of these papers are VLSI and Analog Circuit Testing (66 papers), Integrated Circuits and Semiconductor Failure Analysis (41 papers) and Radiation Effects in Electronics (25 papers). Raimund Ubar is often cited by papers focused on VLSI and Analog Circuit Testing (66 papers), Integrated Circuits and Semiconductor Failure Analysis (41 papers) and Radiation Effects in Electronics (25 papers) and collaborates with scholars based in Estonia, Sweden and Germany. Raimund Ubar's co-authors include Jaan Raik, Artur Jutman, Sergei Devadze, Maksim Jenihhin and Gert Jervan and has published in prestigious journals such as IEEE Transactions on Biomedical Engineering, Microelectronics Reliability and Journal of Systems Architecture
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