E.J. McCluskey
About
E.J. McCluskey has authored 146 papers that have received a total of 3.7k indexed citations.
This includes 99 papers in Electrical and Electronic Engineering, 95 papers in Hardware and Architecture and 28 papers in Computer Networks and Communications. The topics of these papers are VLSI and Analog Circuit Testing (81 papers), Radiation Effects in Electronics (48 papers) and Integrated Circuits and Semiconductor Failure Analysis (46 papers). E.J. McCluskey is often cited by papers focused on VLSI and Analog Circuit Testing (81 papers), Radiation Effects in Electronics (48 papers) and Integrated Circuits and Semiconductor Failure Analysis (46 papers) and collaborates with scholars based in United States, Taiwan and Canada. E.J. McCluskey's co-authors include N.R. Saxena, Subhasish Mitra, Nur A. Touba, Chao-Wen Tseng and Nahmsuk Oh and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Industrial Electronics and Communications of the ACM
In The Last Decade
Explore authors with similar magnitude of impact
Top journals papers by Hua‐Ji Qiu are published in Top countries impacted by papers by Perdita Arndt Top journals papers by Masanori Takaoka are published in Top authors papers by Tadashi Nariai are co-authored with Top fields papers by Vasiliki Michopoulos are about Top countries impacted by papers by Timo Närhi Top fields papers by Shahin Bonakdar are about Top authors papers by Jun Fukushima are co-authored with