E.J. McCluskey
About
E.J. McCluskey has authored 146 papers that have received a total of 3.7k indexed citations.
This includes 99 papers in Electrical and Electronic Engineering, 95 papers in Hardware and Architecture and 28 papers in Computer Networks and Communications. The topics of these papers are VLSI and Analog Circuit Testing (81 papers), Radiation Effects in Electronics (48 papers) and Integrated Circuits and Semiconductor Failure Analysis (46 papers). E.J. McCluskey is often cited by papers focused on VLSI and Analog Circuit Testing (81 papers), Radiation Effects in Electronics (48 papers) and Integrated Circuits and Semiconductor Failure Analysis (46 papers) and collaborates with scholars based in United States, Taiwan and Canada. E.J. McCluskey's co-authors include N.R. Saxena, Subhasish Mitra, Nur A. Touba, Chao-Wen Tseng and Nahmsuk Oh and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Industrial Electronics and Communications of the ACM
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