Etienne Auvray
About
Etienne Auvray has authored 17 papers that have received a total of 33 indexed citations.
This includes 9 papers in Electrical and Electronic Engineering, 8 papers in Hardware and Architecture and 3 papers in Endocrinology, Diabetes and Metabolism. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (9 papers), VLSI and Analog Circuit Testing (8 papers) and Industrial Vision Systems and Defect Detection (3 papers). Etienne Auvray is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (9 papers), VLSI and Analog Circuit Testing (8 papers) and Industrial Vision Systems and Defect Detection (3 papers) and collaborates with scholars based in France, Italy and Czechia. Etienne Auvray's co-authors include A. Virazel, Emmanuel Simeu, H Allannic, Alberto Bosio and Patrick Girard and has published in prestigious journals such as Microelectronics Reliability, IEEE Transactions on Emerging Topics in Computing and Journal of Electronic Testing
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