Fangming Ye
About
Fangming Ye has authored 17 papers that have received a total of 212 indexed citations.
This includes 9 papers in Electrical and Electronic Engineering, 6 papers in Industrial and Manufacturing Engineering and 6 papers in Hardware and Architecture. The topics of these papers are VLSI and Analog Circuit Testing (6 papers), Industrial Vision Systems and Defect Detection (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Fangming Ye is often cited by papers focused on VLSI and Analog Circuit Testing (6 papers), Industrial Vision Systems and Defect Detection (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers) and collaborates with scholars based in United States, Germany and China. Fangming Ye's co-authors include Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu, Farshad Firouzi and Xin Li and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Energy Science & Engineering and ACM Transactions on Design Automation of Electronic Systems
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