Xinli Gu
About
Xinli Gu has authored 31 papers that have received a total of 224 indexed citations.
This includes 15 papers in Electrical and Electronic Engineering, 15 papers in Hardware and Architecture and 8 papers in Artificial Intelligence. The topics of these papers are VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Industrial Vision Systems and Defect Detection (7 papers). Xinli Gu is often cited by papers focused on VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Industrial Vision Systems and Defect Detection (7 papers) and collaborates with scholars based in United States, Sweden and United Kingdom. Xinli Gu's co-authors include Zhaobo Zhang, Krishnendu Chakrabarty, Fangming Ye, Xin Li and Zebo Peng and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and ACM Transactions on Design Automation of Electronic Systems
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