Heiner Lammert
About
Heiner Lammert has authored 14 papers that have received a total of 306 indexed citations.
This includes 7 papers in Mechanical Engineering, 7 papers in Radiation and 6 papers in Electrical and Electronic Engineering. The topics of these papers are Advanced Measurement and Metrology Techniques (7 papers), Advanced X-ray Imaging Techniques (7 papers) and Chemical Mechanical Polishing in Microelectronics Manufacturing (6 papers). Heiner Lammert is often cited by papers focused on Advanced Measurement and Metrology Techniques (7 papers), Advanced X-ray Imaging Techniques (7 papers) and Chemical Mechanical Polishing in Microelectronics Manufacturing (6 papers) and collaborates with scholars based in Germany, United States and United Kingdom. Heiner Lammert's co-authors include Thomas Zeschke, F. Senf, Frank Siewert, G. Reichardt and Tino Noll and has published in prestigious journals such as Review of Scientific Instruments, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and Journal of Electron Spectroscopy and Related Phenomena.
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