Kazumi Hatayama
About
Kazumi Hatayama has authored 23 papers that have received a total of 78 indexed citations.
This includes 19 papers in Hardware and Architecture, 18 papers in Electrical and Electronic Engineering and 6 papers in Biomedical Engineering. The topics of these papers are VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Analog and Mixed-Signal Circuit Design (6 papers). Kazumi Hatayama is often cited by papers focused on VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Analog and Mixed-Signal Circuit Design (6 papers) and collaborates with scholars based in Japan. Kazumi Hatayama's co-authors include Takashi Aikyo, Takashi Ishida, Anna Kuwana, Haruo Kobayashi and Takashi Satō and has published in prestigious journals such as IEEE Transactions on Reliability, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Device and Materials Reliability
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