Takashi Aikyo
About
Takashi Aikyo has authored 13 papers that have received a total of 50 indexed citations.
This includes 12 papers in Hardware and Architecture, 10 papers in Electrical and Electronic Engineering and 6 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (12 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Fault Diagnosis in Complex Systems (5 papers). Takashi Aikyo is often cited by papers focused on VLSI and Analog Circuit Testing (12 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Fault Diagnosis in Complex Systems (5 papers) and collaborates with scholars based in Japan and United States. Takashi Aikyo's co-authors include Kazumi Hatayama, Takashi Satō, Tomoyuki Takahashi, Seiji Kajihara and K. Noda and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEICE Transactions on Information and Systems
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