Seiji Kajihara
About
Seiji Kajihara has authored 62 papers that have received a total of 478 indexed citations.
This includes 56 papers in Electrical and Electronic Engineering, 54 papers in Hardware and Architecture and 8 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (54 papers), Integrated Circuits and Semiconductor Failure Analysis (48 papers) and Radiation Effects in Electronics (13 papers). Seiji Kajihara is often cited by papers focused on VLSI and Analog Circuit Testing (54 papers), Integrated Circuits and Semiconductor Failure Analysis (48 papers) and Radiation Effects in Electronics (13 papers) and collaborates with scholars based in Japan, United States and Germany. Seiji Kajihara's co-authors include Xiaoqing Wen, Kohei Miyase, Irith Pomeranz, Laung‐Terng Wang and Kewal K. Saluja and has published in prestigious journals such as IEEE Access, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Brain Topography
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