Kohei Miyase
About
Kohei Miyase has authored 32 papers that have received a total of 245 indexed citations.
This includes 30 papers in Electrical and Electronic Engineering, 26 papers in Hardware and Architecture and 3 papers in Control and Systems Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (28 papers), VLSI and Analog Circuit Testing (26 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (6 papers). Kohei Miyase is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (28 papers), VLSI and Analog Circuit Testing (26 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (6 papers) and collaborates with scholars based in Japan, United States and Germany. Kohei Miyase's co-authors include Seiji Kajihara, Xiaoqing Wen, Kewal K. Saluja, Tatsuya Suzuki and Laung‐Terng Wang and has published in prestigious journals such as IEEE Transactions on Aerospace and Electronic Systems, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and ACM Transactions on Design Automation of Electronic Systems
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