Kenneth M. Butler
About
Kenneth M. Butler has authored 22 papers that have received a total of 135 indexed citations.
This includes 19 papers in Hardware and Architecture, 18 papers in Electrical and Electronic Engineering and 6 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Fault Diagnosis in Complex Systems (6 papers). Kenneth M. Butler is often cited by papers focused on VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Fault Diagnosis in Complex Systems (6 papers) and collaborates with scholars based in United States, Portugal and France. Kenneth M. Butler's co-authors include John M. Carulli, Mohammad Tehranipoor, Xin Li, Kwang‐Ting Cheng and C.P. Ravikumar and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Journal of Electronic Testing.
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