John M. Carulli
About
John M. Carulli has authored 28 papers that have received a total of 374 indexed citations.
This includes 22 papers in Electrical and Electronic Engineering, 14 papers in Hardware and Architecture and 7 papers in Industrial and Manufacturing Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (11 papers), VLSI and Analog Circuit Testing (11 papers) and Semiconductor materials and devices (9 papers). John M. Carulli is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (11 papers), VLSI and Analog Circuit Testing (11 papers) and Semiconductor materials and devices (9 papers) and collaborates with scholars based in United States, Portugal and Serbia. John M. Carulli's co-authors include Ke Huang, Yiorgos Makris, Nathan Kupp, Kenneth M. Butler and C. P. Beetz and has published in prestigious journals such as Journal of Applied Physics, Proceedings of the IEEE and Japanese Journal of Applied Physics
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