Yiorgos Makris
About
Yiorgos Makris has authored 120 papers that have received a total of 1.3k indexed citations.
This includes 91 papers in Hardware and Architecture, 89 papers in Electrical and Electronic Engineering and 33 papers in Artificial Intelligence. The topics of these papers are VLSI and Analog Circuit Testing (48 papers), Integrated Circuits and Semiconductor Failure Analysis (42 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (39 papers). Yiorgos Makris is often cited by papers focused on VLSI and Analog Circuit Testing (48 papers), Integrated Circuits and Semiconductor Failure Analysis (42 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (39 papers) and collaborates with scholars based in United States, France and Cyprus. Yiorgos Makris's co-authors include Yier Jin, Angelos Antonopoulos, Petros Drineas, Haralampos‐G. Stratigopoulos and John M. Carulli and has published in prestigious journals such as Proceedings of the IEEE, Science Advances and IEEE Access
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