Nathan Kupp

10 papers and 62 indexed citations i.

Nathan Kupp has authored 10 papers that have received a total of 62 indexed citations. This includes 7 papers in Hardware and Architecture, 4 papers in Electrical and Electronic Engineering and 3 papers in Management Science and Operations Research. The topics of these papers are VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Optimal Experimental Design Methods (3 papers). Nathan Kupp is often cited by papers focused on VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Optimal Experimental Design Methods (3 papers) and collaborates with scholars based in United States and France. Nathan Kupp's co-authors include Yiorgos Makris, Petros Drineas, John M. Carulli and Ke Huang and has published in prestigious journals such as IEEE Design and Test and Journal of Electronic Testing